Yale School of Medicine
Education
University of Science and Technology of China, 1992, BS, Chemistry; University of California, Berkeley, 1997, PhD, Chemistry
Professional Area
Developed enhanced Focused Ion Beam Scanning Electron Microscopy (FIB-SEM), which transformed this technology into a robust imaging platform, which has enabled the largest and most detailed brain connectome to date and created a growing 3D atlas of whole cells and tissues at the finest isotropic resolution.
Citation
Recognized for transforming conventional Focused Ion Beam – Scanning Electron Microscopy into a robust imaging platform with 100% effective reliability; capable of years of continuous imaging without defects in the final image stack; Development of Enhanced FIB-SEM technology has enabled significant discoveries in biology and medicine.